Fixed unit test compiler warnings
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@@ -578,7 +578,6 @@ static void testBACnetDateRangeDecodes(void)
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int len;
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int null_len;
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int test_len;
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int outLen2;
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BACNET_DATE_RANGE data;
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BACNET_DATE_RANGE test_data;
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@@ -1212,8 +1211,6 @@ static void testBACDCodeBitString(void)
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BACNET_BIT_STRING value;
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BACNET_BIT_STRING test_value;
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uint8_t apdu[MAX_APDU] = { 0 };
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uint32_t len_value = 0;
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uint8_t tag_number = 0;
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int len, null_len, apdu_len, test_len;
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BACNET_TAG tag = { 0 };
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@@ -1386,12 +1383,12 @@ static void testSignedContextDecodes(void)
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value = BIT(i);
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for (j = 0; j < 8; j++) {
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context_tag = BIT(j);
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test_unsigned_context_codec(value, context_tag);
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test_signed_context_codec(value, context_tag);
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}
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value = BIT(i) | BIT(31);
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for (j = 0; j < 8; j++) {
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context_tag = BIT(j);
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test_unsigned_context_codec(value, context_tag);
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test_signed_context_codec(value, context_tag);
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}
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}
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}
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@@ -1438,7 +1435,6 @@ ZTEST(bacdcode_tests, testEnumeratedContextDecodes)
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static void testEnumeratedContextDecodes(void)
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#endif
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{
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uint8_t apdu[MAX_APDU] = { 0 };
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uint8_t context_tag = 10;
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/* 32-bit value */
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