This CL updates dart:io but not dart:_http. It updates the sdk sources,
the patch files, and tests.
Change-Id: I64c3da407f09fa2bc6eec582049c4ae3a8afbe6d
Reviewed-on: https://dart-review.googlesource.com/52990
Commit-Queue: Zach Anderson <zra@google.com>
Reviewed-by: Lasse R.H. Nielsen <lrn@google.com>
In addition, this removes support for seeding the VM isolate snapshot with Instructions and referencing those Instructions in the isolate snapshot. This was leftover from an earlier experiment to share Instructions between a Core-JIT snapshot and App-JIT snapshots. Removing this reclaims the sign bit on Instruction offsets.
Add missing cases to TypeTestingStubFinder::StubNameFromAddresss.
Change-Id: Ie87216b4e284db1dc3eddb12f38ddbe8a841d312
Reviewed-on: https://dart-review.googlesource.com/50620
Commit-Queue: Ryan Macnak <rmacnak@google.com>
Reviewed-by: Alexander Markov <alexmarkov@google.com>
This includes Fasta, tools and observatory, so the checked-in SDK must
have the lower-case constants.
Change-Id: I8380ad041ad058f7d02ae19caccfecd434d13d75
Reviewed-on: https://dart-review.googlesource.com/50201
Commit-Queue: Lasse R.H. Nielsen <lrn@google.com>
Reviewed-by: Leaf Petersen <leafp@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Closes https://github.com/dart-lang/sdk/issues/32852
Change-Id: Ib79fbe7f043aa88f32bddad62d7656c638914b44
Reviewed-on: https://dart-review.googlesource.com/50944
Commit-Queue: Martin Kustermann <kustermann@google.com>
Reviewed-by: Régis Crelier <regis@google.com>
* Preserve empty lines in the file header.
* Add empty entry to the tool's newly created sections.
* Remove extra empty line at the end of the file.
Change-Id: I271583774d5f5497025a9d85bcadf8b0b9e39e81
Reviewed-on: https://dart-review.googlesource.com/37600
Commit-Queue: Alexander Thomas <athom@google.com>
Reviewed-by: William Hesse <whesse@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Change-Id: I6d33d4ca3d5187a1eb1664078c003061855f0160
Reviewed-on: https://dart-review.googlesource.com/50482
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Commit-Queue: Martin Kustermann <kustermann@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Change-Id: I44a1d5d4b27454ae026aef2a301aada3dd399ea0
Reviewed-on: https://dart-review.googlesource.com/49861
Commit-Queue: Martin Kustermann <kustermann@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
This reverts commit 09eed74a8a.
Reason for revert: Too much SDK code is not yet compliant.
Original change's description:
> Make `void` a static warning to use almost everywhere.
>
> Changed the hint to a StaticWarningCode, since that's the new spec'd
> error type and the hint is no longer needed.
>
> Added a new set of methods to test the cases.
>
> Didn't try to solve the problem generally ("all usages except ... are
> errors" means it easier, in theory, to make a ReportVoidExpressions
> style visitor that catches absolutely all types) because most of the
> work is actually about suppressing errors that are no longer needed.
> Ie, from NO_SUCH_METHOD to USAGE_OF_VOID_RESULT which means we have to
> put the void handling logic into each AST method specially anyway.
>
> Some redundant tests removed.
>
> Don't flag: ternaries, void -> void assignments, void returns in
> dynamic.
>
> Change-Id: Ief8035dcfe582b36b6372180ddcf4e453d320d9c
> Reviewed-on: https://dart-review.googlesource.com/37441
> Commit-Queue: Mike Fairhurst <mfairhurst@google.com>
> Reviewed-by: Leaf Petersen <leafp@google.com>
TBR=leafp@google.com,scheglov@google.com,mfairhurst@google.com
Change-Id: I13ee4c6939468d35506779ade637a040833632f4
No-Presubmit: true
No-Tree-Checks: true
No-Try: true
Reviewed-on: https://dart-review.googlesource.com/39848
Reviewed-by: Mike Fairhurst <mfairhurst@google.com>
Commit-Queue: Mike Fairhurst <mfairhurst@google.com>
Changed the hint to a StaticWarningCode, since that's the new spec'd
error type and the hint is no longer needed.
Added a new set of methods to test the cases.
Didn't try to solve the problem generally ("all usages except ... are
errors" means it easier, in theory, to make a ReportVoidExpressions
style visitor that catches absolutely all types) because most of the
work is actually about suppressing errors that are no longer needed.
Ie, from NO_SUCH_METHOD to USAGE_OF_VOID_RESULT which means we have to
put the void handling logic into each AST method specially anyway.
Some redundant tests removed.
Don't flag: ternaries, void -> void assignments, void returns in
dynamic.
Change-Id: Ief8035dcfe582b36b6372180ddcf4e453d320d9c
Reviewed-on: https://dart-review.googlesource.com/37441
Commit-Queue: Mike Fairhurst <mfairhurst@google.com>
Reviewed-by: Leaf Petersen <leafp@google.com>
asiva