This reverts commit cf78da8a48.
Reason for revert: introduces significant performance regression (~30%) on analyzer benchmarks (warm-analysis) without clearly visible hot-spot.
Original change's description:
> [VM] Reduce Smi size to 32 bit on 64 bit platforms
>
> This reduces small tagged integers on 64 bit platforms from 63 bits to
> 31 bits plus one tag bit.
> This is a step on the way to compile-time-optional compressed pointers
> on 64 bit platforms. See more about this at go/dartvmlearnings
> This causes a slowdown for some uses of integers that don't fit in 31
> signed bits, but because both x64 and ARM64 have unboxed 64 bit
> integers now the performance hit should not be too bad.
>
> This is a reapplication of
> https://dart-review.googlesource.com/c/sdk/+/46244
> It was reverted due to a compilation error on 32 bit
> ARM with DBC.
>
> R=vegorov@google.com
>
> Change-Id: I943de1768519457f0e5a61ef0b4ef204b6a53281
> Reviewed-on: https://dart-review.googlesource.com/51321
> Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
TBR=vegorov@google.com,erikcorry@google.com
# Not skipping CQ checks because original CL landed > 1 day ago.
Change-Id: I8c5b909ec38663b5f5b05f69ef488c97341f8f3d
Reviewed-on: https://dart-review.googlesource.com/54000
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Commit-Queue: Vyacheslav Egorov <vegorov@google.com>
This reduces small tagged integers on 64 bit platforms from 63 bits to
31 bits plus one tag bit.
This is a step on the way to compile-time-optional compressed pointers
on 64 bit platforms. See more about this at go/dartvmlearnings
This causes a slowdown for some uses of integers that don't fit in 31
signed bits, but because both x64 and ARM64 have unboxed 64 bit
integers now the performance hit should not be too bad.
This is a reapplication of
https://dart-review.googlesource.com/c/sdk/+/46244
It was reverted due to a compilation error on 32 bit
ARM with DBC.
R=vegorov@google.com
Change-Id: I943de1768519457f0e5a61ef0b4ef204b6a53281
Reviewed-on: https://dart-review.googlesource.com/51321
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Closes https://github.com/dart-lang/sdk/issues/32852
Change-Id: Ib79fbe7f043aa88f32bddad62d7656c638914b44
Reviewed-on: https://dart-review.googlesource.com/50944
Commit-Queue: Martin Kustermann <kustermann@google.com>
Reviewed-by: Régis Crelier <regis@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Change-Id: I6d33d4ca3d5187a1eb1664078c003061855f0160
Reviewed-on: https://dart-review.googlesource.com/50482
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Commit-Queue: Martin Kustermann <kustermann@google.com>
This reduces small tagged integers on 64 bit platforms from 63 bits to
31 bits plus one tag bit.
This is a step on the way to compile-time-optional compressed pointers
on 64 bit platforms. See more about this at go/dartvmlearnings
This causes a slowdown for some uses of integers that don't fit in 31
signed bits, but because both x64 and ARM64 have unboxed 64 bit
integers now the performance hit should not be too bad.
This reapplies the change reviewed at
https://dart-review.googlesource.com/c/sdk/+/46244R=kustermann@google.com
Change-Id: I605c21506ec7d4c69fa7049bc419b3ee370685fc
Reviewed-on: https://dart-review.googlesource.com/50202
Reviewed-by: Martin Kustermann <kustermann@google.com>
Commit-Queue: Erik Corry <erikcorry@google.com>
Relands 165c583d57
[VM] Introduction of type testing stubs - Part 1
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Reviewed-on: https://dart-review.googlesource.com/44787
Relands f226c22424
[VM] Introduction of type testing stubs - Part 2
This CL starts building type testing stubs specialzed for [Type] objects
we test against.
More specifically, it adds support for:
* Handling obvious fast cases on the call sites (while still having a
call to stub for negative case)
* Handling type tests against type parameters, by loading the value
of the type parameter on the call sites and invoking it's type testing stub.
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subtype-checks.
==> e.g. String/List<dynamic>
* Specialzed type testing stubs for instantiated types where we can
do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the type arguments.
==> e.g. Widget<State>, where we know [Widget] is only extended and not
implemented.
* Specialzed type testing stubs for certain non-instantiated types where we
can do [CidRange]-based subclass-checks for the class and
[CidRange]-based subtype-checks for the instantiated type arguments and
cid based comparisons for type parameters. (Note that this fast-case migth
result in some false-negatives!)
==> e.g. _HashMapEntry<K, V>, where we know [_HashMapEntry] is only
extended and not implemented.
This optimizes cases where the caller uses `new HashMap<A, B>()` and only
uses `A` and `B` as key/values (and not subclasses of it). The false-negative
can occur when subtypes of A or B are used. In such cases we fall back to the
[SubtypeTestCache]-based imlementation.
Reviewed-on: https://dart-review.googlesource.com/44788
Relands 25f98bcc75
[VM] Introduction of type testing stubs - Part 3
The changes include:
* Make AssertAssignableInstr no longer have a call-summary, which
helps methods with several parameter checks by not having to
re-load/re-initialize type arguments registers
* Lazily create SubtypeTestCaches: We already go to runtime to warm up
the caches, so we now also create the caches on the first runtime
call and patch the pool entries.
* No longer load the destination name into a register: We only need
the name when we throw an exception, so it is not on the hot path.
Instead we let the runtime look at the call site, decoding a pool
index from the instructions stream. The destination name will be
available in the pool, at a consecutive index to the subtype cache.
* Remove the fall-through to N=1 case for probing subtypeing tests,
since those will always be handled by the optimized stubs.
* Do not generate optimized stubs for FutureOr<T> (so far it just
falled-through to TTS). We can make optimzed version of that later,
but it requires special subtyping rules.
* Local code quality improvement in the type-testing-stubs: Avoid
extra jump at last case of cid-class-range checks.
There are still a number of optimization opportunities we can do in
future changes.
Reviewed-on: https://dart-review.googlesource.com/46984
Relands 2c52480ec8
[VM] Introduction of type testing stubs - Part 4
In order to avoid generating type testing stubs for too many types in
the system - and thereby potentially cause an increase in code size -
this change introduces a smarter way to decide for which types we should
generate optimized type testing stubs.
The precompiler creates a [TypeUsageInfo] which we use to collect
information. More specifically:
a) We collect the destination types for all type checks we emit
(we do this inside AssertAssignableInstr::EmitNativeCode).
-> These are types we might want to generate optimized type testing
stubs for.
b) We collect type argument vectors used in instance creations (we do
this inside AllocateObjectInstr::EmitNativeCode) and keep a set of
of used type argument vectors for each class.
After the precompiler has finished compiling normal code we scan the set
of destination types collected in a) for uninstantiated types (or more
specifically, type parameter types).
We then propagate the type argument vectors used on object allocation sites,
which were collected in b), in order to find out what kind of types are flowing
into those type parameters.
This allows us to extend the set of types which we test against, by
adding the types that flow into type parameters.
We use this final augmented set of destination types as a "filter" when
making the decision whether to generate an optimized type testing stub
for a given type.
Reviewed-on: https://dart-review.googlesource.com/48640
Issue https://github.com/dart-lang/sdk/issues/32603
Change-Id: I44a1d5d4b27454ae026aef2a301aada3dd399ea0
Reviewed-on: https://dart-review.googlesource.com/49861
Commit-Queue: Martin Kustermann <kustermann@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
This reduces small tagged integers on 64 bit platforms from 63 bits to 31 bits
plus one tag bit.
This is a step on the way to compile-time-optional compressed pointers on 64
bit platforms. See more about this at go/dartvmlearnings
This causes a slowdown for some uses of integers that don't fit in 31 signed
bits, but because both x64 and ARM64 have unboxed 64 bit integers now the
performance hit should not be too bad.
R=kustermann@google.com
Change-Id: I035ed84c29b64f0432cd2d24193eb1c6303c14b0
Reviewed-on: https://dart-review.googlesource.com/46244
Commit-Queue: Erik Corry <erikcorry@google.com>
Reviewed-by: Martin Kustermann <kustermann@google.com>
This CL:
* Adds a field to [RawAbstractType] which will always hold a pointer
to the entrypoint of a type testing stub
* Makes this new field be initialized to a default stub whenever a
instances are created (e.g. via Type::New(), snapshot reader, ...)
* Makes the clustered snapshotter write a reference to the
corresponding [RawInstructions] object when writing the field and do
the reverse when reading it.
* Makes us call the type testing stub for performing assert-assignable
checks.
To reduce unnecessary loads on callsites, we store the entrypoint of the
type testing stubs directly in the type objects. This means that the
caller of type testing stubs can simply branch there without populating
a code object first. This also means that the type testing stubs
themselves have no access to a pool and we therefore also don't hold on
to the [Code] object, only the [Instruction] object is necessary.
The type testing stubs do not setup a frame themselves and also have no
safepoint. In the case when the type testing stubs could not determine
a positive answer they will tail-call a general-purpose stub.
The general-purpose stub sets up a stub frame, tries to consult a
[SubtypeTestCache] and bails out to runtime if this was unsuccessful.
This CL is just the the first, for ease of reviewing. The actual
type-specialized type testing stubs will be generated in later CLs.
Issue https://github.com/dart-lang/sdk/issues/31798
Change-Id: I174a11b3b812799f399a60af799144c2ba3c26ec
Reviewed-on: https://dart-review.googlesource.com/44787
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Reviewed-by: Régis Crelier <regis@google.com>
When the type to test against is instantiated and has no type arguments
there is a high probability that we receive instances of that class or
subclasses at runtime.
This CL therefore extends the fast-path of AssertAssignable/InstanceOf
by checking whether the instance class id is within the cid ranges that
directly/indirectly implement/extend the type to test against.
Currently we have an almost depth-first preorder numbering of class ids
in AOT, but there are exceptions. So each class can have a number of
cid-ranges as subclasses / classes which implement it's interface.
This seems to improve performance of dart-aot-v2
* flutter stock build by 15+%
* DeltaBlueClosures by 10+%
and reduces code size on
* flutter gallery by -3%
Issue https://github.com/dart-lang/sdk/issues/31798
Change-Id: I07dd91589cc3fcd8c5952bdba339e2e2a459e08e
Reviewed-on: https://dart-review.googlesource.com/35620
Commit-Queue: Martin Kustermann <kustermann@google.com>
Reviewed-by: Régis Crelier <regis@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Apart from removing almost 1000 lines of very repetitive code, the idea here is
to change the assembler from a huge pile of arbitrary code into something that
can be used to generate tables of opcodes and their structure. Later, I'd like to
use this to make the disassembler more table driven and less arbitrary, and
perhaps build an x86 simulator in the same vein as the ARM simulator, which
would help me debug (I find the ARM simulator very useful when making low level
changes to the VM and miss its functionality on x86).
R=vegorov@google.com
Bug:
Change-Id: I1ae2c1696f88b67862843c9ac05c827a7c9b9a6e
Reviewed-on: https://dart-review.googlesource.com/25241
Commit-Queue: Erik Corry <erikcorry@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Several tricks here:
* When zeroing registers we can use xorl instead of xorq because the 'l'
variant will zero the top bits.
* test and 'and' instructions with immediate arguments can use 8-bit and 32 bit
variants more heavily.
* mov reg, immediate can use more compact encodings when sign-extension is not
needed.
Performance is better than +1% when measured on Dart2JS.
R=vegorov@google.com
Intel optimization manual says: "Assembly/Compiler Coding Rule 64. (H impact, M
generality) Use the 32-bit versions of instructions in 64-bit mode to reduce
code size unless the 64-bit version is necessary to access 64-bit data or
additional registers."
Bug:
Change-Id: I2a989315c45f8d8ebab719653fbfa2b18ebb77c9
Reviewed-on: https://dart-review.googlesource.com/23400
Commit-Queue: Erik Corry <erikcorry@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
This also means that an orthogonal selection of the core ALU instructions
are available so future programmers don't have to add instructions
to the assembler as needed, which tends to slow down progress.
R=vegorov@google.com
Bug:
Change-Id: I5fea72c70ea7ffbae8efad85aef4ecc96c235cb6
Reviewed-on: https://dart-review.googlesource.com/21140
Commit-Queue: Erik Corry <erikcorry@google.com>
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
There are three types of changes in this CL:
* If there is a repeated per-component sequence of instruction, it is
replaced with a loop (e.g. see Float32x4ConstructorInstr);
* When accessing components in the spilled SIMD values don't use
hardcoded constants but instead compute the offset from op_kind()
(e.g. kFloat32x4WithZ accesses component with index kFloat32x4WithZ - kFloat32x4WithX = 2).
This allows to share code.
* Use setcc and arithmetic to materialize result of the comparison instead of branches;
* Use the fact that true and false are consecutive values in the Thread structure to convert
0/1 to true/false (see Int32x4GetFlagInstr)
* Extract Int32x4 components without spilling the whole SIMD value to the
stack (see Int32x4GetFlagInstr).
This extracted from a larger refactoring CL: https://dart-review.googlesource.com/c/sdk/+/10120
Bug: https://github.com/dart-lang/sdk/issues/30949
Change-Id: Ic3757789a1ca621b267150133991fed5b85da633
Reviewed-on: https://dart-review.googlesource.com/11080
Commit-Queue: Vyacheslav Egorov <vegorov@google.com>
Reviewed-by: Zach Anderson <zra@google.com>
Reviewed-by: Alexander Markov <alexmarkov@google.com>
In this CL most of the code generation logic of UnboxInstr is unified
among architectures and moved to a platform-independent part.
In addition:
* Asm comment corrected for check null slow path.
* Non-instantiated generic types are eagerly converted to dynamic in
type propagator.
Issue: https://github.com/dart-lang/sdk/issues/30480
Change-Id: Idcb2c67938e63ac79cf78d125451bd485247daad
Reviewed-on: https://dart-review.googlesource.com/9741
Reviewed-by: Zach Anderson <zra@google.com>
Reviewed-by: Ryan Macnak <rmacnak@google.com>
Commit-Queue: Alexander Markov <alexmarkov@google.com>
This CL introduces new IL instruction, CheckNullInstr, for testing
if an object is null. This instruction will be used to ensure
correctness when AOT relies on strong mode types, which are nullable
by default (unless proven otherwise).
Code generation of CheckNullInstr is implemented without major code
duplication between different CPUs using common macro-assembler
pseudo-instructions implemented by all platforms.
Also, code generation of GenericCheckBoundInstr is refactored in
the similar way.
Issue: https://github.com/dart-lang/sdk/issues/30480
Change-Id: I35e9b556302fe7db98ce5167b3601f08ddbee642
Reviewed-on: https://dart-review.googlesource.com/4540
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Reviewed-by: Zach Anderson <zra@google.com>
New folder structure (nested under vm/):
- compiler/
- jit/ - JIT specific code
- aot/ - AOT specific code
- backend/ - all middle-end and back-end code (IL, flow graph)
- assembler/ - assemblers and disassemblers
- frontend/ - front ends (AST -> IL, Kernel -> IL)
compiler/README.md would be the documentation root for the compiler
pipeline
Bug: https://github.com/dart-lang/sdk/issues/30575
Change-Id: I2dfd9688793bff737f7632ddc77fca766875ce36
Reviewed-on: https://dart-review.googlesource.com/2940
Reviewed-by: Vyacheslav Egorov <vegorov@google.com>
Commit-Queue: Vyacheslav Egorov <vegorov@google.com>
Vyacheslav Egorov